ISO 2918-1975 肉和肉制品亚硝酸盐含量的测定(参照法)
作者:标准资料网 时间:2024-05-02 07:36:45 浏览:8984
来源:标准资料网
【英文标准名称】:Meatandmeatproducts;Determinationofnitritecontent(Referencemethod)
【原文标准名称】:肉和肉制品亚硝酸盐含量的测定(参照法)
【标准号】:ISO2918-1975
【标准状态】:现行
【国别】:国际
【发布日期】:1975-09
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC34
【标准类型】:()
【标准水平】:()
【中文主题词】:含量测定;肉;化学分析和试验;肉制品;亚硝酸盐;化学分析;基准方法
【英文主题词】:Chemicalanalysisandtesting;Determinationofcontent;Meat;Meatproducts;Nitrites;Referencemethods
【摘要】:Themethodconsistsinextractingofatestportionwithhotwater,precipitatingofproteineandfiltrating.Inpresenceofnitritsformationofaredclouredcomplexbyaddingsulfanilamideandnaphthylethylenediaminehydrochloride,andphotometricmeasurementatawavelengthof538nm.
【中国标准分类号】:C54;X22
【国际标准分类号】:67_120_10
【页数】:3P.;A4
【正文语种】:英语
【英文标准名称】:Gasheatedcateringequipment-Specificrequirements-Openburnersandwokburners
【原文标准名称】:燃气炊事用具.特殊要求.敞口燃烧器和镬燃烧器
【标准号】:BSEN203-2-1-2005
【标准状态】:现行
【国别】:英国
【发布日期】:2005-11-25
【实施或试行日期】:2005-11-25
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:大气的;燃烧器;给养设备;烹饪设备;定义;能量消耗;能源经济学;燃气器具;燃气炉灶;燃气炉膛;气体燃料;燃气动力装置;热负载;工业经济;厨房器具;操作方式;废气监控;敞口的;平锅;特性;安全;安全工程;安全要求;深平底锅;规范(验收);结构体系;试验;贸易;能源利用
【英文主题词】:Atmospheric;Burners;Cateringequipment;Cookingequipment;Definition;Energyconsumption;Energyeconomics;Gasappliances;Gascookers;Gashearthes;Gaseousfuels;Gas-powereddevices;Heatload;Industrialeconomics;Kitchenutensils;Modeofoperation;Monitoringofexhaustgases;Open;Pans;Properties;Safety;Safetyengineering;Safetyrequirements;Saucepans;Specification(approval);Structuralsystems;Testing;Trade;Utilizationofenergy
【摘要】:TobereadinconjunctionwithBSEN203-1
【中国标准分类号】:Y68
【国际标准分类号】:97_040_20
【页数】:20P.;A4
【正文语种】:英语
【英文标准名称】:StandardGuideforUseofanX-RayTester([approximate]10keVPhotons)inIonizingRadiationEffectsTestingofSemiconductorDevicesandMicrocircuits
【原文标准名称】:半导体器件和微电路的电离辐射效应试验中X射线测试仪(近似等于10keV辐射量子)的使用标准指南
【标准号】:ASTMF1467-1999(2005)
【标准状态】:现行
【国别】:
【发布日期】:1999
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:微电子学;X射线仪;电子工程;试验设备
【英文主题词】:Collimator;Electricalconductors-semiconductors;Electronichardness;Experimentaldesign;Hardnesstests-radiation(ofsemiconductors);Ionizingradiation;Lowenergy([aprox]10keVphotons)X-raysources;Microcircuits;Microelectronicdevice
【摘要】:1.1ThisguidecoversrecommendedproceduresfortheuseofX-raytesters(thatis,sourceswithaphotonspectrumhaving[approximate]10keVmeanphotonenergyand[approximate]50keVmaximumenergy)intestingsemiconductordiscretedevicesandintegratedcircuitsforeffectsfromionizingradiation.1.2TheX-raytestermaybeappropriateforinvestigatingthesusceptibilityofwaferlevelordeliddedmicroelectronicdevicestoionizingradiationeffects.Itisnotappropriateforinvestigatingotherradiation-inducedeffectssuchassingle-eventeffects(SEE)oreffectsduetodisplacementdamage.1.3Thisguidefocusesonradiationeffectsinmetaloxidesilicon(MOS)circuitelements,eitherdesigned(asinMOStransistors)orparasitic(asinparasiticMOSelementsinbipolartransistors).1.4InformationisgivenaboutappropriatecomparisonofionizingradiationhardnessresultsobtainedwithanX-raytestertothoseresultsobtainedwithcobalt-60gammairradiation.Severaldifferencesinradiation-inducedeffectscausedbydifferencesinthephotonenergiesoftheX-rayandcobalt-60gammasourcesareevaluated.Quantitativeestimatesofthemagnitudeofthesedifferencesineffects,andotherfactorsthatshouldbeconsideredinsettinguptestprotocols,arepresented.1.5Ifa10-keVX-raytesteristobeusedforqualificationtestingorlotacceptancetesting,itisrecommendedthatsuchtestsbesupportedbycrosscheckingwithcobalt-60gammairradiations.1.6ComparisonsofionizingradiationhardnessresultsobtainedwithanX-raytesterwithresultsobtainedwithalinac,withprotons,etc.areoutsidethescopeofthisguide.1.7CurrentunderstandingofthedifferencesbetweenthephysicaleffectscausedbyX-rayandcobalt-60gammairradiationsisusedtoprovideanestimateoftheratio(number-of-holes-cobalt-60/(number-of-holes-X-ray).SeveralcasesaredefinedwherethedifferencesintheeffectscausedbyXraysandcobalt-60gammasareexpectedtobesmall.Othercaseswherethedifferencescouldpotentiallybeasgreatasafactoroffouraredescribed.1.8ItshouldberecognizedthatneitherX-raytestersnorcobalt-60gammasourceswillprovide,ingeneral,anaccuratesimulationofaspecifiedsystemradiationenvironment.Theuseofeithertestsourcewillrequireextrapolationtotheeffectstobeexpectedfromthespecifiedradiationenvironment.Inthisguide,wediscussthedifferencesbetweenX-raytesterandcobalt-60gammaeffects.Thisdiscussionshouldbeusefulasbackgroundtotheproblemofextrapolationtoeffectsexpectedfromadifferentradiationenvironment.However,theprocessofextrapolationtotheexpectedrealenvironmentistreatedelsewhere(1,2).1.9ThetimescaleofanX-rayirradiationandmeasurementmaybemuchdifferentthantheirradiationtimeintheexpecteddeviceapplication.Informationontime-dependenteffectsisgiven.1.10PossiblelateralspreadingofthecollimatedX-raybeambeyondthedesiredirradiatedregiononawaferisalsodiscussed.1.11Informationisgivenaboutrecommendedexperimentalmethodology,dosimetry,anddatainterpretation.1.12Radiationtestingofsemiconductordevicesmayproduceseveredegradationoftheelectricalparametersofirradiateddevicesandshouldthereforebeconsideredadestructivetest.1.13Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L04;N50
【国际标准分类号】:31_020
【页数】:18P.;A4
【正文语种】:
